Pulsed device measurements and applications

IEEE Transactions on Microwave Theory and Techniques

Volumn 44, Issue 12 PART 2, 1996, Pages 2718-2723

  Scott, Jonathan ^a   Rathmell, James Grantley ^a   Parker, Anthony ^a   Sayed, Mohamed ^a  

^a UNIVERSITY OF SYDNEY   (Australia)

Author keywords

[No Author keywords available]

Indexed keywords

CHARGE TRAPPING EFFECTS; PULSED MEASUREMENT SYSTEMS;

COMPUTER SOFTWARE; CURRENT VOLTAGE CHARACTERISTICS; ELECTRIC BREAKDOWN OF SOLIDS; ELECTRIC CURRENT MEASUREMENT; ELECTRIC MEASURING INSTRUMENTS; GAIN MEASUREMENT; NONDESTRUCTIVE EXAMINATION; PULSE CIRCUITS; THERMAL EFFECTS; TIMING CIRCUITS; VOLTAGE MEASUREMENT;

MICROWAVE DEVICES;

EID: 0030415379     PISSN: 00189480     EISSN: None     Source Type: Journal    
DOI: 10.1109/22.554657     Document Type: Article

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