A new on-wafer large-signal waveform measurement system with 40 GHz harmonic bandwidth

IEEE MTT-S International Microwave Symposium Digest

Volumn 3, Issue , 1992, Pages 1435-1438

  van Raay, Friedbert ^a   Kompa, Gunter ^a  

^a NONE

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER AIDED ANALYSIS; ELECTRIC MEASURING INSTRUMENTS; HIGH ELECTRON MOBILITY TRANSISTORS; WAVEFORM ANALYSIS;

HEMT MEASUREMENTS; MICROWAVE ANALYZERS; ON-WAFER MEASUREMENT; WAVEFORM MEASUREMENT;

MICROWAVE MEASUREMENT;

EID: 0027060654     PISSN: 0149645X     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (7)