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Volumn 68, Issue 3, 1999, Pages 339-342
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Transducer properties of AFM microprobes conformally covered by ALE-deposited SnO2 thin films
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Author keywords
[No Author keywords available]
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Indexed keywords
ATOMIC FORCE MICROSCOPY;
COATINGS;
EPITAXIAL GROWTH;
FILM GROWTH;
MECHANICAL PROPERTIES;
OPTICAL PROPERTIES;
PROBES;
THIN FILMS;
TIN COMPOUNDS;
TRANSDUCERS;
ATOMIC LAYER EPITAXY (ALE);
TIN OXIDE;
SILICON SENSORS;
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EID: 0033097314
PISSN: 09478396
EISSN: None
Source Type: Journal
DOI: 10.1007/s003390050899 Document Type: Article |
Times cited : (6)
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References (22)
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