Tip characterization from AFM images of nanometric spherical particles

Langmuir

Volumn 14, Issue 9, 1998, Pages 2562-2566

  Ramirez Aguilar, Kathryn A ^a   Rowlen, Kathy L ^a  

^a UNIVERSITY OF COLORADO   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; PARTICLE SIZE ANALYSIS; POLYSTYRENES; SILICA; TRANSMISSION ELECTRON MICROSCOPY;

TIP CHARACTERIZATION;

NANOSTRUCTURED MATERIALS;

EID: 0032048837     PISSN: 07437463     EISSN: None     Source Type: Journal    
DOI: 10.1021/la971277o     Document Type: Article

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