A comparison of surface roughness as measured by atomic force microscopy and x-ray scattering

Journal of Applied Physics

Volumn 82, Issue 6, 1997, Pages 2944-2953

  Munkholm, A ^a   Brennan, S ^a   Carr, E C ^b  

^a SLAC NATIONAL ACCELERATOR LABORATORY   (United States)

^b HEWLETT PACKARD COMPANY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000105480     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.366129     Document Type: Review

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