Influence of atomic force microscope tip-sample interaction on the study of scaling behavior

Applied Physics Letters

Volumn 71, Issue 10, 1997, Pages 1347-1349

  Aue J ^a   De Hosson, J Th M ^a  

^a UNIVERSITY OF GRONINGEN   (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001064474     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.120415     Document Type: Article

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