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Volumn 194, Issue 2-3, 1999, Pages 299-306

Characterization of reflection scanning near-field optical microscopy and scanning tunnelling optical microscopy/photon scanning tunnelling microscopy working in preliminary approach constant height scanning mode

Author keywords

Linear transfer; Near field optics; PSTM; Resolution; SNOM; STOM

Indexed keywords

OPTICAL DATA STORAGE; SCANNING TUNNELING MICROSCOPY;

EID: 0033064698     PISSN: 00222720     EISSN: None     Source Type: Journal    
DOI: 10.1046/j.1365-2818.1999.00566.x     Document Type: Conference Paper
Times cited : (8)

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