Equivalence of constant-height and constant-intensity images in scanning near-field optical microscopy

Optics Letters

Volumn 21, Issue 16, 1996, Pages 1208-1210

  Carminati, Rémi ^a   Greffet, Jean Jacques ^a  

^a CNRS   (France)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001869620     PISSN: 01469592     EISSN: None     Source Type: Journal    
DOI: 10.1364/OL.21.001208     Document Type: Article

References (21)

1. H. Heinzelmann and D. Pohl, Appl. Phys. A 59, 89 (1994).
2. D. Courjon, K. Sarayeddine, and M. Spajer, Opt. Commun. 71, 23 (1989); F. de Fornel, J.-P. Goudonnet, L. Salomon, and E. Lesniewska, Proc. SPIE 1139, 77 (1989).
3. D. Courjon, K. Sarayeddine, and M. Spajer, Opt. Commun. 71, 23 (1989); F. de Fornel, J.-P. Goudonnet, L. Salomon, and E. Lesniewska, Proc. SPIE 1139, 77 (1989).
4. T. Ferrell, S. Sharp, and R. Warmack, Ultramicroscopy 42-44, 408(1992).
5. E. Betzig, M. Isaacson, and A. Lewis, Appl. Phys. Lett. 51, 2088 (1987).
6. N. F. Van Hulst, M. H. P. Moers, and B. Bolger, J. Microsc. 171, 95 (1993); F. Baida, C. Mered, and D. Courjon, Microsc. Microanal. Microstruct. 5, 19 (1994); S. Kawata, Y. Inouye, and T. Sugiura, Jpn. J. Appl. Phys. 33, L1725 (1994); R. Bachelot, P. Gleyzes, and A. C. Boccara, Opt. Lett. 20, 1924 (1995).
7. N. F. Van Hulst, M. H. P. Moers, and B. Bolger, J. Microsc. 171, 95 (1993); F. Baida, C. Mered, and D. Courjon, Microsc. Microanal. Microstruct. 5, 19 (1994); S. Kawata, Y. Inouye, and T. Sugiura, Jpn. J. Appl. Phys. 33, L1725 (1994); R. Bachelot, P. Gleyzes, and A. C. Boccara, Opt. Lett. 20, 1924 (1995).
8. N. F. Van Hulst, M. H. P. Moers, and B. Bolger, J. Microsc. 171, 95 (1993); F. Baida, C. Mered, and D. Courjon, Microsc. Microanal. Microstruct. 5, 19 (1994); S. Kawata, Y. Inouye, and T. Sugiura, Jpn. J. Appl. Phys. 33, L1725 (1994); R. Bachelot, P. Gleyzes, and A. C. Boccara, Opt. Lett. 20, 1924 (1995).
9. N. F. Van Hulst, M. H. P. Moers, and B. Bolger, J. Microsc. 171, 95 (1993); F. Baida, C. Mered, and D. Courjon, Microsc. Microanal. Microstruct. 5, 19 (1994); S. Kawata, Y. Inouye, and T. Sugiura, Jpn. J. Appl. Phys. 33, L1725 (1994); R. Bachelot, P. Gleyzes, and A. C. Boccara, Opt. Lett. 20, 1924 (1995).
10. R. Carminati, J.-J. Greffet, N. Garcia, and M. Nieto-Vesperinas, Opt. Lett. 21, 501 (1996).
11. C. Girard, Scanning 16, 333 (1994).
12. D. Van Labeke and D. Barchiesi, J. Opt. Soc. Am. A 10, 2193 (1993).
13. R. Carminati and J.-J. Greffet, Opt. Commun. 116, 316 (1995).
14. J. Cites, M. F. M. Sanghadasa, C. S. Sung, R. C. Reddick, R. J. Warmack, and T. L. Ferrell, J. Appl. Phys. 71, 7 (1992).
15. R. Carminati and J.-J. Greffet, J. Opt. Soc. Am. A 12, 2716 (1995).
16. J.-J. Greffet, A. Sentenac, and R. Carminati, Opt. Commun. 116, 20 (1995).
17. J.-J. Greffet and R. Carminati, in Optics at the Nanometer Scale, M. Nieto-Vesperinas and N. Garcia, eds. (Kluwer, Dordrecht, The Netherlands, 1996), pp. 1-26.
18. F. Pincemin, A. Sentenac, and J.-J. Greffet, J. Opt. Soc. Am. A 11, 1117 (1994).
19. S. Bozhevolnyi, S. Bernsten, and E. Bozhelvolnaya, J. Opt. Soc. Am. A 11, 609 (1994).
20. N. Garcia and M. Nieto-Vesperinas, Opt. Lett. 18, 2090 (1993); Opt. Lett. 20, 949 (1995).
21. N. Garcia and M. Nieto-Vesperinas, Opt. Lett. 18, 2090 (1993); Opt. Lett. 20, 949 (1995).