Application of fourier algorithm to near field optical images: Local resolution estimation

Microscopy Microanalysis Microstructures

Volumn 8, Issue 1, 1997, Pages 1-10

  Barchiesi, Dominique ^a  

^a UNIVERSITÉ DE FRANCHE COMTÉ   (France)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0002462175     PISSN: 11542799     EISSN: None     Source Type: Journal    
DOI: 10.1051/mmm:1997101     Document Type: Article

References (41)

1. Courjon D., Near-field imaging: some attempts to define an apparatus function, J. Microscopy 177 (1995) 180-185.
2. Lacoste Th., Huser Th., Heinzelmann H. and Güntherrodt H.-J., Scanning near-field optical microscopes for high resolution imaging, in "Photons and Local Probes", Othmar Marti and Rolf Möller, Eds. (Kluwer Academic Publishers, Dordrecht, 1995) vol. 300 of NATO ASI Series E: Appl. Sei., pp. 123-132.
3. Krenn J.R., Somitsch D., Gotschy W., Leitner A. and Aussenegg F.R., Near-field optical investigations on nanometric silver particles, in "Photons and Local Probes", Othmar Marti and Rolf Möller, Eds. (Kluwer Academic Publishers, Dordrecht, 1995) vol. 300 of NATO ASI Series E: Appl. Sei., pp. 181-187.
4. Van Hülst N.F., Segerink F.B. and Böiger B., High resolution imaging of dielectric surfaces with an evanescent field optical microscope, Opt. Commun. 87 (1992) 212-218.
5. Maslieri R.U., Tatsumi H.Y., Katayamaand Ohtsu M., Observation of subcellular nanostructure of single neurons with an illumination mode photon scanning tunneling microscope, Optics Commun. 120 (1995) 325-334.
6. de Fornel F., Salomon L., Adam P., Bourillot E. and Goudonnet J.P., Resolution of the photon scanning tunneling microscope: influence of physical parameters, Ultramicroscopy 42-44 (1992) 422-429.
7. Bergossi 0., Spajer M. and Schiavone P., Local index measurements by reflection near field optical microscopy, in "Near Field Optics - 3" (Kluwer Academic Publishers, Brno, Czech Republic, 1995) pp. 179-180.
8. Maheswari R.U., Kadono H. and Ohtsu M., Power spectral analysis for evaluating optical near-field images of 20 nm gold particles, Optics Commun. 131 (1996) 133-142.
9. Girard Ch. and Spajer M., Model for reflection near-field optical microscopy, Appl. Opt. 29 (1990) 3726-3733.
10. Girard Ch. and Bouju X., Self-consistent study of dynamical and polarization effects in near field optical microscopy, J. Opt. Soc. Am. B 9 (1992) 298-305.
11. Vigoureux J.M., Depasse F. and Girard Gh., Superresolution of near-field optical microscopy defined from properties of confined electromagnetic waves, Appl. Opt. 31 (1992) 3036-3045.
12. Van Labeke D. and Barchiesi D., Probes for scanning tunneling optical microscopy: A theoretical comparison, J. Opt. Soc. Am. A 10 (1993) 2193-2201.
13. Barchiesi D. and Van Labeke D., Une modélisation de l'influence de la metallisation des objets et de la forme des sondes en SNOM, Microsc. Microanal. Microstruct. 5 (1994) 1-10.
14. Cho K., Ohfuti Y. and Arima K., Study of scanning near-field optical microscopy (SNOM) by nonlocal response theory, Jpn J. Appl. Phys. 34 (1994) 267-270.
15. Garcia N. and Nieto-Vesperinas M., Theory for the apertureless near-field optical microscope: Image resolution, Appl. Phys. Lett. 66 (1995) 3399-3400.
16. Bonnet N., On the use of correlation functions for improving the image signal-to-noise ratio, Optik 80 (1988) 103-106.
17. Carminati R. and Greffet J.-J., Two-dimensional numerical simulation of the photon scanning tunneling microscope. Concept of transfer function, Optics Commun. 116 (1995) 316-321; erratum in Optics Commun. 120 (1995) 371.
18. Barchiesi D., Bergossi O., Spajer M. and Pieralli C., Image resolution in reflection scanning near-field optical microscopy (R-SNOM) using shear-force (ShF) feedback: Characterization using spline and fourier spectrum, Appl. Opt. 36 (1997) 2171-2177.
19. Spajer M., Courjon D., Sarayedine K., Jalocha A. and Vigoureux J.M., Microscopic en champ proche par réflexion, Revue Phys. Appl. 26 (1989) 111-112.
20. Goodman J.W., Introduction to Fourier optics (Me Graw-Hill, New-York, 1968).
21. Sheppard C.J.R., Gu M. and Mao X.Q., Three-dimensional coherent transfer function in a reflection-mode confocal scanning microscope, Optics Commun. 81 (1991) 281-284.
22. Reiss G., Schneider F., Vancea J. and Hoffman H., Scanning tunneling microscopy on rough surfaces: Deconvolution of constant current images, Appl. Phys. Lett. 57 (1990) 867-869.
23. Vigoureux J.M. and Courjon D., Detection of nonradiative fields in light of the Heisenberg uncertainty principle and the Rayleigh criterion, Appl. Opt. 31 (1992) 3170-3177.
24. Kann J.L., Muster T.D., Froehlich F.F., Ziolkowski R.W. and Judkins J.B., Linear behavior of near-field optical system, J. Opt. Soc. Am. A 12 (1995) 1677-1682.
25. Nakano T. and Kawata S., Numerical analysis of the near-field diffraction pattern of a small aperture, J. Mod. Opt. 39 (1992) 645-661.
26. Garcia N. and Nieto-Vesperinas M., A direct solution to the inverse scattering problem in near-field optical microscopy: Object structure reconstruction, in "Photons and Local Probes", Othmar Marti and Rolf Möller, Eds. (Kluwer Academic Publishers, Dordrecht, 1995) vol. 300 of NATO ASI Series E: Appl. Sei., pp. 47-57.
27. Madrazo A. and Nieto-Vesperinas M., Surface structure and polariton interactions in the scattering of electromagnetic waves from a cylinder in front of conducting grating: theory for the reflection photon scanning tunneling microscope, J. Opt. Soc. Am. A 13 (1996) 785-795.
28. Pieralli C., Statistical estimation of point spread function applied to scanning near-field optical microscopy, Optics Commun. 108 (1994) 203-208.
29. Pieralli C., Estimation of point-spread functions and modulation-transfer functions of optical devices by statistical properties of randomly distributed surfaces, Appl. Opt. 33 (1994) 8186-8193.
30. Greffet J.-J., Santenac A. and Carminati R., Surface profile reconstruction using near-field data, Optics Commun. 116 (1995) 20-24.
31. Nieto-Vesperinas M. and Madrazo A., A theoretical study of near-field interactions with local probes, in "Photons and Local Probes", Othmar Marti and Rolf Möller, Eds. (Kluwer Academic Publishers, Dordrecht, 1995) vol. 300 of NATO ASI Series E: Appl. Sei., pp. 35-46.
32. Barchiesi D., Modélisation Des Microscopes Optiques En Champ Proche : STOM et SNOM. Optimisation et Spectroscopie., Ph.D. thesis, Université de Franche-Comté (Feb. 23 1993).
33. Barchiesi D. and Van Labeke D., Application of mie scattering of evanescent waves to scanning optical tunneling microscopy theory, J. Mod. Opt. 40 (1993) 1239-1254.
34. Barchiesi D. and Van Labeke D., Scanning tunneling optical microscopy (STOM): Theoretical study of polarization effects with two models of tip, in "Near Field Optics", D. W. Pohl and D. Courjon, Eds. (Kluwer Academic Publishers, Dordrecht, 1993) vol. 242 of NATO ASI Series E: Appl. Sei., pp. 179-188.
35. Bozhevolnyi S., Keller O. and Xiao M., On the resolution limit in near-field optical microscopy, in "Near Field Optics", D. W. Pohl and D. Courjon, Eds. (Kluwer Academic Publishers, Dordrecht, 1993) vol. 242 of NATO ASI Series E: Appl. Sei., pp. 229-238.
36. Novotny L., Pohl D.W. and Regli P., Near-field, far-field and imaging properties of the 2D aperture snom, Ultramicroscopy 57 (1995) 180-188.
37. Barchiesi D., A 3-d method for calculating near-field diffracted by nano-structures: Application to thin-coated nano-sources, Optics Commun. 126 (1996) 7-13.
38. Van Labeke D. and Barchiesi D., Scanning-tunneling optical microscopy: a theoreticalmacroscopic approach, J. Opt. Soc. Am. A 9 (1992) 732-739.
39. Baida F., Mered C. and Courjon D., Microscope àdouble détection: STOM-AFM, principe et résultats, Mlcrosc. Microanal. Microstruct. (1994) 19-29.
40. Barchiesi D. and Van Labeke D., PSTM: An alternative to measure local variation of optical index, Microsc. Microanal. Microstruct. 5 (1994) 435-446.
41. Bonnet N., Lebonvallet S-, El Hila H., Colliot G. and Beorchia A., Quantitative evaluation of the signal to noise ratio and of its improvement (or degradation) by digital filters, J. Phys. Ill France 1 (1991) 1349-1358.