Reconstruction of corrugated dielectric surfaces with a model of a photon scanning tunneling microscope: Influence of the tip on the near field

Journal of the Optical Society of America A: Optics and Image Science, and Vision

Volumn 14, Issue 3, 1997, Pages 618-628

  Madrazo, A ^a   Nieto Vesperinas, M ^a  

^a UNIVERSIDAD AUTÓNOMA DE MADRID   (Spain)

Author keywords

[No Author keywords available]

Indexed keywords

DIELECTRIC MATERIALS; DIFFRACTION GRATINGS; ELECTROMAGNETIC FIELD EFFECTS; FOURIER OPTICS; FREQUENCIES; INTEGRAL EQUATIONS; LIGHT POLARIZATION; PERTURBATION TECHNIQUES; SCANNING TUNNELING MICROSCOPY; SURFACES; VACUUM;

CORRUGATED SURFACES; HOLOGRAPHIC SURFACE RELIEF GRATING; INCIDENT ANGLE; NEAR FIELD OPTICS; PHOTON SCANNING TUNNELING MICROSCOPY; TIP SURFACE INTERACTIONS;

LIGHT SCATTERING;

EID: 0031103020     PISSN: 10847529     EISSN: 15208532     Source Type: Journal    
DOI: 10.1364/JOSAA.14.000618     Document Type: Article

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