Numerical study of the tip-sample interaction in the photon scanning tunneling microscope

Optics Communications

Volumn 126, Issue 4-6, 1996, Pages 285-292

  Weeber, J C ^a   De Fornel, F ^a   Goudonnet, J P ^a  

^a UNIVERSITÉ DE BOURGOGNE   (France)

Author keywords

[No Author keywords available]

Indexed keywords

CALCULATIONS; DEFECTS; DIELECTRIC MATERIALS; LASER BEAMS; LIGHT POLARIZATION; MATHEMATICAL MODELS; OPTICAL GLASS; PHOTONS; SCANNING TUNNELING MICROSCOPY; SENSORS; SUBSTRATES; SURFACES;

DIELECTRIC SURFACE DEFECTS; DIELECTRIC TIP; GLASS AIR INTERFACE; PHOTON SCANNING TUNNELING MICROSCOPE; SURFACE DEFECT;

OPTICAL MICROSCOPY;

EID: 0030141486     PISSN: 00304018     EISSN: None     Source Type: Journal    
DOI: 10.1016/0030-4018(96)00011-9     Document Type: Article

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