Image resolution in reflection scanning near-field optical microscopy using shear-force feedback: Characterization with a spline and fourier spectrum

Applied Optics

Volumn 36, Issue 10, 1997, Pages 2171-2177

  Barchiesi, Dominique ^a   Bergossi, Olivier ^a   Spajer, Michel ^a   Pieralli, Christian ^a  

^a UNIVERSITÉ DE FRANCHE COMTÉ   (France)

Author keywords

Image processing; Near field; Resolution; Scanning near field optical microscopy; Shear force microscopy

Indexed keywords

EID: 0001366943     PISSN: 1559128X     EISSN: 21553165     Source Type: Journal    
DOI: 10.1364/AO.36.002171     Document Type: Article

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