Scanning near-field optical microscopy: Transfer function and resolution limit

Optics Communications

Volumn 155, Issue 4-6, 1998, Pages 245-250

  Blattner, P ^a   Herzig, H P ^a   Dandliker R ^a  

^a UNIVERSITY OF NEUCHÂTEL   (Switzerland)

Author keywords

Rigorous diffraction theory; Scanning near field optical microscope; Sub wavelength resolution

Indexed keywords

ELECTROMAGNETIC WAVE DIFFRACTION; LIGHT MEASUREMENT; OPTICAL RESOLVING POWER; OPTICAL TRANSFER FUNCTION;

SCANNING NEAR-FIELD OPTICAL MICROSCOPY;

OPTICAL MICROSCOPY;

EID: 0032178836     PISSN: 00304018     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0030-4018(98)00401-5     Document Type: Article

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