Global minimization in reconstruction of the scattering-length density profile by X-ray reflectivity data

Physica B: Condensed Matter

Volumn 221, Issue 1-4, 1996, Pages 542-546

  Samoilenko, I I ^a   Shchedrin, B M ^a,b   Feigin, L A ^a  

^a SHUBNIKOV INSTITUTE OF CRYSTALLOGRAPHY   (Russian Federation)

^b MOSCOW STATE UNIVERSITY   (Russian Federation)

Author keywords

[No Author keywords available]

Indexed keywords

GENETIC ALGORITHMS; NEUTRON SCATTERING; REFLECTOMETERS; SIMULATED ANNEALING;

GLOBAL MINIMIZATION; LOCAL MINIMA; REFLECTIVITY DATA FITTING; SCATTERING LENGTH DENSITY PROFILE; X RAY REFLECTIVITY DATA;

X RAY ANALYSIS;

EID: 0030562974     PISSN: 09214526     EISSN: None     Source Type: Journal    
DOI: 10.1016/0921-4526(95)00978-7     Document Type: Article

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