Numerical analysis of x-ray reflectivity data from organic thin films at interfaces

Journal of Chemical Physics

Volumn 104, Issue 20, 1996, Pages 8159-8164

  Asmussen, Axel ^a   Riegler, Hans ^b  

^a JOHANNES GUTENBERG UNIVERSITY   (Germany)

^b MAX PLANCK INSTITUTE OF COLLOIDS AND INTERFACES   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000330865     PISSN: 00219606     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.471492     Document Type: Article

References (12)

1. A. Guinier, X-Ray Difffraction (Freeman & Co., San Francisco, 1963).
2. L. G. Parrat, Phys. Rev. 95, 359 (1954).
3. S. H. Chen, X. L. Zhou, and B. L. Carvalho, Prog. Colloid Polymer Sci. 93, 85 (1993).
4. I. W. Hamleyn and J. S. Pedersen, J. Appl. Cryst. 27, 29 (1994).
5. J. S. Pedersen and W. Hamleyn, J. Appl. Cryst. 27, 36 (1994).
6. J. Als-Nielsen, in Structures and Dynamics of Surfaces, edited by W. Schommers and P. von Blanckenhagen (Springer, Berlin, 1987), Vol. 2.
7. L. Lekner, Theory of Reflection of Electromagnetic and Particle Waves (Nijnhoff, Dordrecht, 1987).
8. M. Allain, J. J. Benattar, F. Rieutard, and P. Robin, Europhys. Lett. 3 309 (1987).
9. L. Nevot and P. Croce, Rev. Phys. Appl. 15, 761 (1980).
10. P. S. Pershan, Faraday Discuss. Chem. Soc. 89, 231 (1990).
11. L. A. Feigin, Y. M. Lvov, and V. I. Troitsky, Sov. Sci. Rev. A. Phys. 11, 285 (1989).
12. W. H. Press, S. A. Teukolsky, W. T. Vetterling, and B. P. Flannery, Numerical Recipes, 3rd ed. (Cambridge University, Cambridge, 1992).