Moments analysis of X-ray reflection profiles

Physica B: Condensed Matter

Volumn 221, Issue 1-4, 1996, Pages 538-541

  Rieutord, F ^a   Braslau, A ^b   Simon, R ^a   Lauter, H J ^c   Pasyuk, V ^c  

^a CEA GRENOBLE   (France)

^b DIF   (France)

^c INSTITUT LAUE LANGEVIN   (France)

Author keywords

[No Author keywords available]

Indexed keywords

FOURIER TRANSFORMS; PHASE INTERFACES; REFRACTIVE INDEX; SURFACES; X RAY ANALYSIS;

BORN APPROXIMATION; INTERFACIAL DENSITY PROFILE; NEUTRON REFLECTIVITY METHODS; X RAY REFLECTIVITY METHODS;

NEUTRON REFLECTION;

EID: 0030562953     PISSN: 09214526     EISSN: None     Source Type: Journal    
DOI: 10.1016/0921-4526(95)00977-9     Document Type: Article

References (12)

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2. A. Herpin, C.R. Acad. Sci. 225 (1947) 182; F. Abéles, Ann. Phys. Paris 3 (1948) 504; F. Abéles, Ann. Phys. Paris 5 (1950) 596; M. Born and E. Wolf, Principles of Optics (Pergamon, London, 1980; 6th ed.).
3. A. Herpin, C.R. Acad. Sci. 225 (1947) 182; F. Abéles, Ann. Phys. Paris 3 (1948) 504; F. Abéles, Ann. Phys. Paris 5 (1950) 596; M. Born and E. Wolf, Principles of Optics (Pergamon, London, 1980; 6th ed.).
4. A. Herpin, C.R. Acad. Sci. 225 (1947) 182; F. Abéles, Ann. Phys. Paris 3 (1948) 504; F. Abéles, Ann. Phys. Paris 5 (1950) 596; M. Born and E. Wolf, Principles of Optics (Pergamon, London, 1980; 6th ed.).
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6. See, for example, R. von Mises, Mathematical Theory of Probability and Statistics (Academic Press, New York, 1964) or W.T. Eadie, D. Drijard, F.E. James, M. Roos and B. Sadoulet, Statistical Methods in Experimental Physics (North-Holland, Amsterdam, 1971).
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8. Such expansion is fairly standard in the theory of probability and statistics [2].
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