A ghost story: Spatio-temporal response characteristics of an indirect- detection flat-panel imager

Medical Physics

Volumn 26, Issue 8, 1999, Pages 1624-1641

  Siewerdsen, J H ^a   Jaffray, D A ^a  

^a WILLIAM BEAUMONT HOSPITAL   (United States)

Author keywords

Amorphous silicon; Cone beam computed tomography; Digital x ray imaging; Flat panel imager; Image lag; Image persistence

Indexed keywords

AMORPHOUS SILICON; COMPUTERIZED TOMOGRAPHY; ITERATIVE METHODS; MAMMOGRAPHY; NONDESTRUCTIVE EXAMINATION; OPTICAL SYSTEMS; X RAY RADIOGRAPHY;

CONE-BEAM COMPUTED TOMOGRAPHY; DIGITAL X-RAY IMAGING; FLAT-PANEL IMAGERS; IMAGE LAGS; IMAGE PERSISTENCE;

IMAGE ANALYSIS;

SILICON DERIVATIVE;

ARTICLE; IMAGE ANALYSIS; IMAGE QUALITY; PRIORITY JOURNAL; RADIATION EXPOSURE; SIGNAL NOISE RATIO; X RAY;

EID: 0032772594     PISSN: 00942405     EISSN: None     Source Type: Journal    
DOI: 10.1118/1.598657     Document Type: Article

References (52)

1. L. E. Antonuk, J. Boudry, W. Huang, D. L. McShan, E. J. Morton, J. Yorkston, M. J. Longo, and R. A. Street, "Demonstration of megavoltage and diagnostic x-ray imaging with hydrogenated amorphous silicon arrays," Med. Phys. 19, 1455-1466 (1992).
2. W. Zhao and J. A. Rowlands, "X-ray imaging using amorphous selenium: Feasibility of a flat panel self-scanned detector for digital radiology," Med. Phys. 22, 1595-1604 (1995).
3. J. M. Boudry, Evaluation of Hydrogenated Amorphous Silicon Photodiodes and Field-Effect Transistors for Use as Elements of Two-Dimensional X-ray Imaging Arrays (UMI Dissertation Services, Ann Arbor, MI, 1996).
4. L. E. Antonuk et al., "Initial performance evaluation of an indirect-detection, active matrix flat-panel imager (AMFPI) prototype for megavoltage imaging," Int. J. Radiat. Oncol., Biol., Phys. 42, 437-452 (1998).
5. P. Munro and D. C. Bouius, "X-ray quantum limited portal imaging using amorphous silicon flat-panel arrays," Med. Phys. 25, 689-702 (1998).
6. D. A. Jaffray, J. H. Siewerdsen, and D. G. Drake, "Performance of a volumetric CT scanner based upon a flat-panel imaging array," Proc. SPIE 3659, 204-214 (1999).
7. R. Ning, D. Lee, X. Wang, Y. Zhang, D. Conover, D. Zhang, and C. Williams, "Selenium flat panel detector-based volume tomographic angiography imaging: Phantom studies," Proc. SPIE 3336, 316-324 (1998).
8. R. Ning, X. Tang, R. Yu. D. Zhang, and D. Conover, "Flat panel detector-based cone beam volume CT imaging: Detector evaluation," Proc. SPIE 3659, 192-203 (1999).
9. L. E. Antonuk, Y. El-Mohri, J. H. Siewerdsen, J. Yorkston, W. Huang, V. E. Scarpine, and R. A. Street, "Empirical investigation of the signal performance of a high-resolution, indirect detection, active matrix flat-panel imager (AMFPI) for fluoroscopic and radiographic operation," Med. Phys. 24, 51-70 (1997).
10. R. A. Street, I. Fujieda, R. Weisfield, S. Nelson, and P. Nylen, "Large area 2-dimensional a-Si:H imaging arrays," Mater. Res. Soc. Symp. Proc. 258, 1145-1150 (1992).
11. M. J. Powell, I. D. French, J. R. Hughes, N. C. Bird, O. S. Davies, C. Glasse, and J. E. Curran, "Amorphous silicon image sensor arrays," Mater. Res. Soc. Symp. Proc. 258, 1127-1137 (1992).
12. L. E. Antonuk, J. Yorkston, W. Huang, J. Boudry, E. J. Morton, M. J. Longo, and R. A. Street, "Factors affecting image quality for megavoltage and diagnostic x-ray a-Si:H imaging arrays," Mater. Res. Soc. Symp. Proc. 258, 1069-1074 (1992).
13. I. Fujieda, R. A. Street, R. L. Weisfield, S. Nelson, P. Nylen, V. Perez-Mendez, and G. Cho, "High sensitivity readout of 2D a-Si image sensors," Jpn. J. Appl. Phys., Part 1 32, 198-204 (1993).
14. L. E. Antonuk, J. Yorkston, W. Huang, J. Siewerdsen, and R. A. Street, "Considerations for high frame rate operation of two-dimensional a-Si:H imaging arrays," Mater. Res. Soc. Symp. Proc. 297, 945-950 (1993).
15. U. Schiebel et al., "Fluoroscopic x-ray imaging with amorphous silicon thing-film arrays," Proc. SPIE 2163, 129-140 (1994).
16. T. Graeve, W. Huang, S. M. Alexander, and Y. Li, "Amorphous silicon image sensor for x-ray applications," Proc. SPIE 2415 (1995).
17. T. Graeve, Y. Li, A. Fabans, and W. Huang, "High-resolution amorphous silicon image sensor," Proc. SPIE 2708, 494-498 (1996).
18. J. Chabbal et al., "Amorphous silicon x-ray image sensor," Proc. SPIE 2708, 499-510 (1996).
19. R. L. Weisfield, R. A. Street, R. Apte, and A. Moore, "An improved page-size 127 μm pixel amorphous-silicon image sensor for x-ray diagnostic medical imaging applications," Proc. SPIE 3032, 14-21 (1997).
20. T. J. C. Bruijns et al., "Technical and clinical results of an experimental flat dynamic (digital) x-ray image detector (FDXD) system with real-time corrections," Proc. SPIE 3336, 33-44 (1998).
21. N. Jung et al., "Dynamic x-ray imaging system based on an amorphous silicon thin-film array," Proc. SPIE 3336, 396-407 (1998).
22. B. Polischuk, Z. Shukri, A. Legros, and H. Rougeot, "Selenium direct converter structure for static and dynamic x-ray detection in medical imaging applications," Proc. SPIE 3336, 494-504 (1998).
23. A. Tsukamoto, S. Yamada, T. Tomisaki, M. Tanaka, and T. Sakaguchi, "Development of a selenium-based flat-panel detector for real-time radiography and fluoroscopy," Proc. SPIE 3336, 388-395 (1998).
24. D. L. Lee, L. K. Cheung, B. Rodricks, and G. F. Powell, "Improved imaging performance of a 14×17-inch direct radiography system using Se/TFT detector," Proc. SPIE 3336, 14-23 (1998).
25. R. L. Weisfield, M. Hartney, R. Schneider, K. Aflatooni, and R. Lujan, "High performance amorphous silicon image sensor for x-ray diagnostic medical imaging applications," Proc. SPIE 3659, 307-317 (1999).
26. P. R. Granfors, "Performance characteristics of an amorphous silicon flat panel x-ray imaging detector," Proc. SPIE 3659, 480-490 (1999).
27. R. E. Colbeth et al., "Characterization of a third generation, multi-mode sensor panel," Proc. SPIE 3659, 491-500 (1999).
28. J. Yorkston, L. E. Antonuk, Y. El-Mohri, K. W. Jee, W. Huang, M. Maolinbay, X. Rong, and J. H. Siewerdsen, "Improved spatial resolution in flat-panel imaging systems," Proc. SPIE 3336, 556-563 (1998).
29. J. Yorkston, L. E. Antonuk, N. Seraji, W. Huang, J. Siewerdsen, and Y. El-Mohri, "Evaluation of the MTF for a-Si:H imaging arrays," Proc. SPIE 2163, 141-148 (1994).
30. J. Yorkston, L. E. Antonuk, N. Seraji, W. Huang, J. Siewerdsen, and Y. El-Mohri, "MTF measurements with high resolution a-Si:H imaging arrays," Proc. SPIE 2432, 260-269 (1995).
31. J. Earnhart and E. Chaney, "Modulation transfer function for a large area amorphous silicon image receptor," Phys. Med. Biol. 42, 2531-2540 (1997).
32. J. H. Siewerdsen, L. E. Antonuk, Y. El-Mohri, J. Yorkston, W. Huang, and I. A. Cunningham, "Signal, noise power spectrum, and detective quantum efficiency of indirect-detection flat-panel imagers for diagnostic radiology," Med. Phys. 25, 614-628 (1998).
33. J. H. Siewerdsen, L. E. Antonuk, Y. El-Mohri, J. Yorkston, W. Huang, J. M. Boudry, and I. A. Cunningham, "Empirical and theoretical investigation of the noise performance of indirect detection, active matrix flat-panel imagers (AMFPIs) for diagnostic radiology," Med. Phys. 24, 71-89 (1997).
34. J. H. Siewerdsen, Signal, Noise, and Detective Quantum Efficiency of a-Si:H Flat-Panel Imagers (UMI Dissertation Services, Ann Arbor, MI, 1998).
35. D. G. Drake, D. A. Jaffray, and J. W. Wong, "A prototype amorphous silicon array based radiotherapy portal imager," Proc. SPIE 3032, 32-41 (3032)
36. P. Xue and D. L. Wilson, "Effects of motion blurring in x-ray fluoroscopy," Med. Phys. 25, 587-599 (1998).
37. Y. Matsunaga, F. Hatori, T. Hiroyuki, and O. Yoshida, "Analysis of signal to noise ratio of photoconductive layered solid-state imaging device," IEEE Trans. Electron Devices 42, 38-42 (1995).
38. M. D. Wright et al., "Amorphous silicon dual mode medical imaging system," Proc. SPIE 3336, 505-514 (1998).
39. R. E. Colbeth et al., "Flat panel imaging system for fluoroscopy applications," Proc. SPIE 3336, 376-387 (1998).
40. EG&G Heimann Optoelectronics GmbH, Germany, Weher Koppel 3, D-65199 Wiesbaden (product information).
41. J. A. Shepherd, S. M. Gruner, M. W. Tate, and M. Tecotzky, "Study of afterglow in x-ray phosphors for use on fast-framing charge-coupled device detectors," Opt. Eng. (Bellingham) 36, 3212-3222 (1997).
42. S. Rudin, J. J. Patel, and D. R. Bednarek, "Decay time measurements of imaging phosphor materials," Med. Phys. (submitted).
43. J. G. Mainprize and M. J. Yaffe, "The effect of phosphor persistence on image quality in digital x-ray scanning systems," Proc. SPIE 2708, 85-94 (1996).
44. J. G. Mainprize and M. J. Yaffe, "The effect of phosphor persistence on image quality in digital x-ray scanning systems," Med. Phys. 25, 2440-2454 (1998).
45. G. Blasse, "Scintillator materials," Chem. Mater. 6, 1465-1475 (1994).
46. R. A. Street, Hydrogenated Amorphous Silicon (Cambridge University Press, New York, 1991).
47. S. M. Sze, Physics of Semiconductor Devices (Wiley, New York, 1990).
48. P. Bhattacharya, Semiconductor Optoelectronic Devices (Prentice-Hall, Englewood Cliffs, NJ, 1994).
49. L. E. Antonuk, J. H. Siewerdsen, J. Yorkston, and W. Huang, "Radiation response of amorphous silicon imaging arrays at diagnostic energies," IEEE Trans. Nucl. Sci. 41, 1500-1505 (1994).
50. J. G. Proakis and D. G. Manolakis, Digital Signal Processing: Principles, Algorithms, and Applications, 2nd ed. (Macmillan, New York, 1992).
51. Signal Processing Toolbox for Use with Matlab (The MathWorks Inc., Natick, MA, 1988).
52. E. A. Schiff, R. A. Street, and R. L. Weisfield, "Reverse bias currents in amorphous silicon nip sensors," J. Non-Cryst. Solids 198-200, 1155-1158 (1996).