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Volumn 3336, Issue , 1998, Pages 376-387

Flat panel imaging system for fluoroscopy applications

Author keywords

Amorphous silicon; Flat panel; Fluoroscopy; Imaging; Noise; Radiography; Sensor; X ray

Indexed keywords

AMORPHOUS SILICON; IMAGE PROCESSING; MAGNETIC FIELDS; OPTIMIZATION; RADIOGRAPHY; SENSITIVITY ANALYSIS; VIDEO CAMERAS; X RAY ANALYSIS;

EID: 0346615265     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.317037     Document Type: Conference Paper
Times cited : (51)

References (4)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.