High-resolution amorphous silicon image sensor

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 2708, Issue , 1996, Pages 494-498

  Graeve, Thorsten ^a   Li, Youming ^a   Fabans, Andrew ^a   Huang, Wingo ^a  

^a EG&G   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

AMORPHOUS SILICON; HIGH RESOLUTION IMAGING; NYQUIST LIMIT; X RAY IMAGE SENSORS;

PERFORMANCE; PHOTODIODES; PHOTONS; SCINTILLATION; SEMICONDUCTING SILICON; SENSORS; THIN FILM TRANSISTORS; X RAY RADIOGRAPHY;

MEDICAL IMAGING;

EID: 0029714709     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (9)