Amorphous silicon x-ray image sensor

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 2708, Issue , 1996, Pages 499-510

  Chabbal, Jean ^a   Chaussat, Christophe ^a   Ducourant, Thierry ^a   Fritsch, Lionel ^a   Michailos, Jean ^a   Spinnler, V ^a   Vieux, Gerard ^a   Arques, Marc ^a   Hahm, Gerhard ^a   Hoheisel, Martin ^a   Horbaschek, Heinz ^a   Schulz, Reiner ^a   Spahn, M ^a  

^a Fr ^*  (France)

Author keywords

[No Author keywords available]

Indexed keywords

AMORPHOUS SILICON; DIGITAL RADIOGRAPHY; FLAT PANEL DETECTORS; FLUOROSCOPY; X RAY IMAGE SENSORS;

DIGITAL IMAGE STORAGE; IMAGE QUALITY; PERFORMANCE; PHOTODETECTORS; PRODUCT DESIGN; SCINTILLATION; SEMICONDUCTING SILICON; SENSORS; SIGNAL TO NOISE RATIO; X RAY RADIOGRAPHY;

MEDICAL IMAGING;

EID: 0029712073     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (12)