Signal, noise power spectrum, and detective quantum efficiency of indirect-detection flat-panel imagers for diagnostic radiology

Medical Physics

Volumn 25, Issue 5, 1998, Pages 614-628

  Siewerdsen, J H ^a   Antonuk, L E ^a   El Mohri, Y ^a   Yorkston, J ^a   Huang, W ^a   Cunningham, I A ^b  

^a UNIVERSITY OF MICHIGAN   (United States)

^b ROBARTS RESEARCH INSTITUTE   (Canada)

Author keywords

Amorphous silicon; Cascaded systems analysis; Detective quantum efficiency; Digital x ray imaging; Flat panel imager; Noise power spectrum

Indexed keywords

AMORPHOUS SILICON; BIOMEDICAL SIGNAL PROCESSING; DIAGNOSTIC RADIOGRAPHY; EFFICIENCY; FLUORESCENT SCREENS; GADOLINIUM COMPOUNDS; PIXELS; POWER SPECTRUM; RADIATION; RADIOLOGY; SPECTRUM ANALYSIS; SYSTEMS ANALYSIS; TERBIUM COMPOUNDS; THIN FILM TRANSISTORS; X RAY RADIOGRAPHY; X RAY SCREENS;

CASCADED SYSTEMS ANALYSIS; DETECTIVE QUANTUM EFFICIENCY; DIGITAL X-RAY IMAGING; FLAT-PANEL IMAGERS; NOISE POWER SPECTRUM;

QUANTUM EFFICIENCY;

SILICON;

ARTICLE; DIAGNOSTIC IMAGING; FLUOROSCOPY; IMAGE PROCESSING; INFORMATION PROCESSING; POWER SPECTRUM; PRIORITY JOURNAL; QUANTUM CHEMISTRY; X RAY;

EID: 0031805838     PISSN: 00942405     EISSN: None     Source Type: Journal    
DOI: 10.1118/1.598243     Document Type: Article

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