Dynamic x-ray imaging system based on an amorphous silicon thin-film array

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 3336, Issue , 1998, Pages 396-407

  Jung, N ^a   Alving, P L ^a   Busse, F ^a   Conrads, N ^a   Meulenbrugge, H M ^a   Rutten W ^a   Schiebel, U ^a   Weibrecht, M ^a   Wieczorek, H ^a  

^a PHILIPS RESEARCH LABORATORIES   (Germany)

Author keywords

All solid state x ray detectors; Dynamic x ray imaging system; Large area thin film electronic

Indexed keywords

AMORPHOUS MATERIALS; CROSSTALK; EVAPORATION; OPTIMIZATION; PHOSPHORS; PHOTODIODES; RADIOGRAPHY; SENSITIVITY ANALYSIS; THIN FILMS; X RAY ANALYSIS;

ELECTRONIC NOISE; X-RAY IMAGING SYSTEMS;

IMAGING SYSTEMS;

EID: 0032401548     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.317040     Document Type: Conference Paper

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