Characterization of a third generation, multi-mode sensor panel

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 3659, Issue II, 1999, Pages 491-500

  Colbeth, Richard E ^a   Cooper III, Virgil N ^a   Gilblom, David L ^a   Harris, Richard ^a   Job, Isaias D ^a   Klausmeier Brown, Martin E ^a   Marc, Marc,el ^a   Pavkovich, John ^a   Seppi, Edward J ^a   Shapiro, Edward G ^a   Wright, Michael D ^a   Yu, J Michael ^a  

^a VARIAN MEDICAL SYSTEMS   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

AMORPHOUS SILICON; COMPUTERIZED TOMOGRAPHY; DIAGNOSTIC RADIOGRAPHY; IMAGING SYSTEMS; MAGNETIC FIELDS; PHOTODIODES; SEMICONDUCTING SILICON; SILICON SENSORS; THIN FILM TRANSISTORS; X RAY APPARATUS; X RAY RADIOGRAPHY;

FLUOROSCOPY; SPOT FILMS; X RAY CONVERSION SCREENS; X RAY IMAGING SYSTEMS;

IMAGE SENSORS;

EID: 0032594602     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Article

References (11)