The use of through focus exit wave reconstruction and quantitative electron diffraction in the structure determination of superconductors

Micron

Volumn 30, Issue 5, 1999, Pages 395-416

  Zandbergen, H W ^a   Bokel, R ^a   Connolly, E ^a   Jansen, J ^a,b  

^a DELFT UNIVERSITY OF TECHNOLOGY   (Netherlands)

^b UNIVERSITY OF ANTWERP   (Belgium)

Author keywords

Atomic structure determination; Electron microscopy; Superconducting films; Through focus exit wave reconstruction

Indexed keywords

EID: 0032722657     PISSN: 09684328     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0968-4328(99)00042-6     Document Type: Article

References (41)

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