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Volumn 382, Issue 6587, 1996, Pages 144-146
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A crystal structure determined with 0.02 Å accuracy by electron microscopy
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Author keywords
[No Author keywords available]
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Indexed keywords
CHEMICAL BONDS;
ELECTRON DIFFRACTION;
ELECTRON MICROSCOPY;
ELECTRONS;
IMAGE PROCESSING;
LATTICE CONSTANTS;
OXIDES;
SINGLE CRYSTALS;
TITANIUM COMPOUNDS;
X RAY CRYSTALLOGRAPHY;
X RAY POWDER DIFFRACTION;
ELECTRON CRYSTALLOGRAPHY;
INORGANIC CRYSTALS;
CRYSTAL ATOMIC STRUCTURE;
ELEMENT;
OXIDE;
SELENIUM;
TITANIUM;
ARTICLE;
CRYSTAL STRUCTURE;
CRYSTALLOGRAPHY;
ELECTRON MICROSCOPY;
IMAGE PROCESSING;
MICROANALYSIS;
POWDER;
PRIORITY JOURNAL;
X RAY DIFFRACTION;
X RAY SPECTROMETRY;
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EID: 0030199824
PISSN: 00280836
EISSN: None
Source Type: Journal
DOI: 10.1038/382144a0 Document Type: Article |
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Times cited : (145)
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References (18)
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