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Volumn 32, Issue 10 A, 1999, Pages

Influence of substitutional carbon on the Si/Ge interdiffusion studied by X-ray diffractometry at superlattice structures

(1)  Zaumseil, P a  

a IHP   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ATMOSPHERIC PRESSURE; CARBON; COMPOSITION EFFECTS; HYDROSTATIC PRESSURE; POINT DEFECTS; SEMICONDUCTOR SUPERLATTICES; SILICON; TEMPERATURE; X RAY DIFFRACTION ANALYSIS;

EID: 0032689287     PISSN: 00223727     EISSN: None     Source Type: Journal    
DOI: 10.1088/0022-3727/32/10A/316     Document Type: Article
Times cited : (9)

References (16)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.