Elasticity studies of the critical thickness of an epilayer deposited on a compliant substrate

Acta Materialia

Volumn 47, Issue 4, 1999, Pages 1289-1296

  Zhang, T Y ^a   Su, Y J ^a  

^a HONG KONG UNIVERSITY OF SCIENCE AND TECHNOLOGY   (Hong Kong)

Author keywords

[No Author keywords available]

Indexed keywords

BOUNDARY CONDITIONS; DISLOCATIONS (CRYSTALS); ELASTICITY; ELECTRIC INSULATING MATERIALS; FOURIER TRANSFORMS; MOLECULAR BEAM EPITAXY; POISSON RATIO; SUBSTRATES;

SEMICONDUCTOR-ON-INSULATOR CONFIGURATION;

SEMICONDUCTING FILMS;

EID: 0032652121     PISSN: 13596454     EISSN: None     Source Type: Journal    
DOI: 10.1016/S1359-6454(98)00414-5     Document Type: Article

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