Characterization and optimization of infrared poly SiGe bolometers

IEEE Transactions on Electron Devices

Volumn 46, Issue 4, 1999, Pages 675-682

  Sedky, Sherif ^a,b   Fiorini, Paolo ^a   Baert, Kris ^a   Hermans, Lou ^a   Mertens, Robert ^a  

^a IMEC   (Belgium)

^b ROMA TRE UNIVERSITY   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC POTENTIAL; INFRARED DETECTORS; MATHEMATICAL MODELS; OPTIMIZATION; SEMICONDUCTING SILICON COMPOUNDS; SIGNAL NOISE MEASUREMENT; TEMPERATURE MEASUREMENT; THERMAL CONDUCTIVITY;

FOCAL PLANE ARRAYS; LOW FREQUENCY NOISE; TEMPERATURE COEFFICIENT OF RESISTANCE;

BOLOMETERS;

EID: 0032651257     PISSN: 00189383     EISSN: None     Source Type: Journal    
DOI: 10.1109/16.753700     Document Type: Article

References (21)

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