Growth and properties of semiconductor bolometers for infrared detection

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 2554, Issue , 1995, Pages 43-54

  Unewisse, Mark H ^a   Craig, Brian I ^a   Watson, Rodney J ^a   Reinhold, Olaf ^a   Liddiard, Kevin C ^a  

^a Defence Science and Technology   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRONIC EXCESS NOISE; MICROBOLOMETERS; MICROCRYSTALLINE PHASES; SEMICONDUCTOR BOLOMETERS; SILICON GERMANIDE;

BOLOMETERS; CRYSTAL GROWTH; MICROMACHINING; PERFORMANCE; SEMICONDUCTOR MATERIALS;

INFRARED DETECTORS;

EID: 0029519274     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (12)