Compliance measurements of confined polystyrene solutions by atomic force microscopy

Physical Review Letters

Volumn 76, Issue 8, 1996, Pages 1272-1275

  Overney, R M ^a   Leta, D P ^a   Pictroski, C F ^a   Rafailovich, M H ^b   Liu, Y ^b   Quinn, J ^b   Sokolov, J ^b   Eisenberg, A ^c   Overney, G ^d  

^a EXXONMOBIL UPSTREAM RESEARCH COMPANY   (United States)

^b STONY BROOK UNIVERSITY   (United States)

^c MCGILL UNIVERSITY   (Canada)

^d UNIVERSITY OF NEW MEXICO   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 5544224688     PISSN: 00319007     EISSN: 10797114     Source Type: Journal    
DOI: 10.1103/PhysRevLett.76.1272     Document Type: Article

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