Compositional mapping of semiconductor structures by friction force microscopy

Applied Physics Letters

Volumn 68, Issue 16, 1996, Pages 2297-2299

  Tamayo, J ^a   Gonzalez L ^a   Gonzalez Y ^a   Garcia R ^a  

^a INSTITUTO DE MICROELECTRÓNICA DE MADRID   (Spain)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001489637     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.116169     Document Type: Article

References (18)

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16. 2 This is a typical value for hydrocarbons monolayers. We have assumed that a monolayer of hydrocarbons coats both tip and sample (see Ref. 1).
17. J. Tamayo and R. García (unpublished).
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