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Volumn 75, Issue 5, 1999, Pages 686-688

Nucleation layer microstructure, grain size, and electrical properties in GaN grown on a-plane sapphire

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL DEFECTS; CRYSTAL MICROSTRUCTURE; CRYSTAL ORIENTATION; GRAIN SIZE AND SHAPE; METALLORGANIC VAPOR PHASE EPITAXY; NUCLEATION; SAPPHIRE; SEMICONDUCTING ALUMINUM COMPOUNDS; SEMICONDUCTING GALLIUM COMPOUNDS; SEMICONDUCTOR GROWTH;

EID: 0032621994     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.124482     Document Type: Article
Times cited : (22)

References (18)
  • 15
    • 85034154156 scopus 로고    scopus 로고
    • private communication
    • R. Beanland (private communication).
    • Beanland, R.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.