Impurity contamination of GaN epitaxial films from the sapphire, SiC and ZnO substrates

Applied Physics Letters

Volumn 71, Issue 23, 1997, Pages 3385-3387

  Popovici, Galina ^a,c   Kim, Wook ^a   Botchkarev, Andrei ^a   Tang, Haipeng ^a   Morkoç, Hadis ^a,d   Solomon, James ^b  

^a University of Illinois at Urbana Champaign   (United States)

^b Unversity of Dayton Research Institute   (United States)

^c Rockbit International   (United States)

^d AIR FORCE RESEARCH LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0343241116     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.120343     Document Type: Article

References (13)

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