Study of the optical and structural properties of silicon-carbon nanometric powder using infrared phase modulated ellipsometry and electron microscopy

Physica Status Solidi (A) Applied Research

Volumn 175, Issue 1, 1999, Pages 373-381

  Garcia Caurel, E ^a   Viera, G ^a   Bertran, E ^a   Canillas, A ^a  

^a UNIVERSITY OF BARCELONA   (Spain)

Author keywords

[No Author keywords available]

Indexed keywords

ELLIPSOMETRY; HYDROGENATION; MORPHOLOGY; NANOSTRUCTURED MATERIALS; PARTICLE SIZE ANALYSIS; POWDER METALS; SCANNING ELECTRON MICROSCOPY; SUBSTRATES; TRANSMISSION ELECTRON MICROSCOPY;

INFRARED PHASE MODULATED ELLIPSOMETRY (IRPME); SILICON-CARBON NANOMETRIC POWDERS;

AMORPHOUS MATERIALS;

EID: 0032594844     PISSN: 00318965     EISSN: None     Source Type: Journal    
DOI: 10.1002/(SICI)1521-396X(199909)175:1<373::AID-PSSA373>3.0.CO;2-E     Document Type: Article

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