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Volumn 8, Issue 2-5, 1999, Pages 364-368

High nucleation rate in pure SiC nanometric powder by a combination of room temperature plasmas and post-thermal treatments

Author keywords

Nanocrystalline; Plasma CVD; Silicon carbide; Ultrafine powder

Indexed keywords

ANNEALING; ELECTRON DIFFRACTION; FOURIER TRANSFORM INFRARED SPECTROSCOPY; HYDROGENATION; METHANE; NANOSTRUCTURED MATERIALS; NUCLEATION; OXIDATION; PLASMA ENHANCED CHEMICAL VAPOR DEPOSITION; POWDERS; SILANES; TRANSMISSION ELECTRON MICROSCOPY;

EID: 0032608309     PISSN: 09259635     EISSN: None     Source Type: Journal    
DOI: 10.1016/s0925-9635(98)00306-9     Document Type: Article
Times cited : (6)

References (15)
  • 1
    • 85001714913 scopus 로고    scopus 로고
    • in: E.L. Fleischer (Ed.), MRS Bulletin, Pittsburgh, PA, USA Publisher: Materials Research Society, March 1997 No.3.
    • W.J. Choyke, G. Pensl, Silicon carbide electronic materials and devices, in: E.L. Fleischer (Ed.), MRS Bulletin, Pittsburgh, PA, USA, 1997. Publisher: Materials Research Society, March 1997, Volume 22, No.3.
    • (1997) Silicon Carbide Electronic Materials and Devices , vol.22
    • Choyke, W.J.1    Pensl, G.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.