Proton damage effects in linear integrated circuits

IEEE Transactions on Nuclear Science

Volumn 45, Issue 6 PART 1, 1998, Pages 2632-2637

  Rax, B G ^a   Johnston, A H ^a   Lee, C I ^a  

^a CALIFORNIA INSTITUTE OF TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

INTEGRATED CIRCUIT TESTING; PROTON IRRADIATION; RADIATION DAMAGE; RADIATION HARDENING; TRANSISTORS;

PROTON TESTING;

LINEAR INTEGRATED CIRCUITS;

EID: 0032306851     PISSN: 00189499     EISSN: None     Source Type: Journal    
DOI: 10.1109/23.736507     Document Type: Article

References (12)

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