Damage correlations in semiconductors exposed to gamma, electron and proton radiations

IEEE Transactions on Nuclear Science

Volumn 40, Issue 6, 1993, Pages 1372-1379

  Summers, Geoffrey P ^a,b   Burke, Edward A ^c   Shapiro, Philip ^c   Messenger, Scott R ^c   Walters, Robert J ^a  

^a NAVAL RESEARCH LABORATORY   (United States)

^b UNIVERSITY OF MARYLAND BALTIMORE COUNTY   (United States)

^c SFA INC   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CORRELATION METHODS; ELECTRONS; ENERGY DISSIPATION; GAMMA RAYS; MONTE CARLO METHODS; PROTONS; RADIATION DAMAGE; SEMICONDUCTING GALLIUM ARSENIDE; SEMICONDUCTING INDIUM PHOSPHIDE; SEMICONDUCTING SILICON; SEMICONDUCTOR DEVICES;

ELECTRON RADIATION; NONIONIZING ENERGY LOSS; PROTON RADIATION;

SEMICONDUCTOR MATERIALS;

EID: 0027844647     PISSN: 00189499     EISSN: 15581578     Source Type: Journal    
DOI: 10.1109/23.273529     Document Type: Article

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