Models for total dose degradation of linear integrated circuits

IEEE Transactions on Nuclear Science

Volumn 34, Issue 6, 1987, Pages 1474-1480

  Johnston, A H ^a   Plaag, R E ^a  

^a BOEING COMPANY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 72349094974     PISSN: 00189499     EISSN: 15581578     Source Type: Journal    
DOI: 10.1109/TNS.1987.4337502     Document Type: Article

References (15)

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