-
1
-
-
0027148071
-
Designing for success: Reliability technology in the concurrent engineering era
-
J. R. Fragola, 'Designing for success: reliability technology in the concurrent engineering era', Proc. 1993 Ann. R&M Symp., 1993, pp. 77-89.
-
(1993)
Proc. 1993 Ann. R&M Symp.
, pp. 77-89
-
-
Fragola, J.R.1
-
2
-
-
11744305161
-
Policy statement of RFP requirements
-
US Ass. Sec. Army, 'Policy statement of RFP requirements', Microelectron. Reliab., 12, 389 (1996).
-
(1996)
Microelectron. Reliab.
, vol.12
, pp. 389
-
-
-
3
-
-
84889485739
-
Panel discussion "Reliability predictions: Their use and misuse"
-
M. Pecht, 'Panel discussion "Reliability predictions: their use and misuse"', Proc. 1994 Ann. R&M Symp., 1994, pp. 386-389.
-
(1994)
Proc. 1994 Ann. R&M Symp.
, pp. 386-389
-
-
Pecht, M.1
-
4
-
-
2342530172
-
A comparison of predicted MTBFs to field and test data
-
A. Wood and J. Elerath, 'A comparison of predicted MTBFs to field and test data', Proc. 1994 Ann. R&M Symp., 1994, pp. 153-156.
-
(1994)
Proc. 1994 Ann. R&M Symp.
, pp. 153-156
-
-
Wood, A.1
Elerath, J.2
-
5
-
-
0029184593
-
Consideration of component failure mechanisms in the reliability assessment of electronic equipment: Addressing the constant failure rate assumption
-
D. E. Mortin, J. G. Krolewski and M. J. Cushing, 'Consideration of component failure mechanisms in the reliability assessment of electronic equipment: addressing the constant failure rate assumption', Proc. 1995 Ann. R&M Symp., 1995, pp. 54-59.
-
(1995)
Proc. 1995 Ann. R&M Symp.
, pp. 54-59
-
-
Mortin, D.E.1
Krolewski, J.G.2
Cushing, M.J.3
-
6
-
-
0029734440
-
Reliability evaluation: A field experience from Motorola's cellular base transceiver systems
-
R. Bothwell, et al., 'Reliability evaluation: a field experience from Motorola's cellular base transceiver systems', Proc. 1996 Ann. R&M Symp., 1996, pp. 348-359.
-
(1996)
Proc. 1996 Ann. R&M Symp.
, pp. 348-359
-
-
Bothwell, R.1
-
7
-
-
0024052974
-
Reliability prediction: A constructive critique of MIL-HDBK-217E
-
H. S. Blanks, 'Reliability prediction: a constructive critique of MIL-HDBK-217E', Qual. Reliab. Engng. Int., 4, 227-234 (1988).
-
(1988)
Qual. Reliab. Engng. Int.
, vol.4
, pp. 227-234
-
-
Blanks, H.S.1
-
8
-
-
0030836122
-
Panel discussion "Commercial off-the-shelf (COTS) integration and support"
-
D. Verma, 'Panel discussion "Commercial off-the-shelf (COTS) integration and support"', Proc. 1997 Ann. R&M Symp., 1997, pp. 181-183.
-
(1997)
Proc. 1997 Ann. R&M Symp.
, pp. 181-183
-
-
Verma, D.1
-
10
-
-
0028467726
-
Predicting the reliability of electronic equipment
-
M. Pecht and F. Nash, 'Predicting the reliability of electronic equipment', Proc. IEEE, 82, 992-1004 (1994).
-
(1994)
Proc. IEEE
, vol.82
, pp. 992-1004
-
-
Pecht, M.1
Nash, F.2
-
11
-
-
0029206496
-
Understanding and solving the real reliability assurance problems
-
M. Pecht, F. Nash and J. Lory, 'Understanding and solving the real reliability assurance problems', Proc. 1995 Ann. R&M Symp., 1995, pp. 159-161.
-
(1995)
Proc. 1995 Ann. R&M Symp.
, pp. 159-161
-
-
Pecht, M.1
Nash, F.2
Lory, J.3
-
12
-
-
0030274030
-
Wafer level reliability: Process control for reliability
-
T. E. Turner, 'Wafer level reliability: process control for reliability', Microelectron. Reliab., 36, 1839-1846 (1996).
-
(1996)
Microelectron. Reliab.
, vol.36
, pp. 1839-1846
-
-
Turner, T.E.1
-
13
-
-
0029735316
-
Modelling and estimation of wafer yields and defect densities from microelectronic test structure data
-
C. K. Hansen and P. Thyregod, 'Modelling and estimation of wafer yields and defect densities from microelectronic test structure data'. Qual. Reliab. Engng. Int., 12, 9-17 (1996).
-
(1996)
Qual. Reliab. Engng. Int.
, vol.12
, pp. 9-17
-
-
Hansen, C.K.1
Thyregod, P.2
-
14
-
-
0030790571
-
Effectiveness of yield-estimation and reliability prediction based on wafer test-chip measurements
-
C. K. Hansen, 'Effectiveness of yield-estimation and reliability prediction based on wafer test-chip measurements', Proc. 1997 Ann. R&M Symp., 1997, pp. 142-148.
-
(1997)
Proc. 1997 Ann. R&M Symp.
, pp. 142-148
-
-
Hansen, C.K.1
-
15
-
-
0030273975
-
Relation between yield and reliability of ICs and application to failure rate assessment and reduction in the one-digit FIT and PPM reliability era
-
J. van der Pol, F. G. Kuper and E. R. Ooms, 'Relation between yield and reliability of ICs and application to failure rate assessment and reduction in the one-digit FIT and PPM reliability era', Microelectron. Reliab., 36, 1603-1610 (1996).
-
(1996)
Microelectron. Reliab.
, vol.36
, pp. 1603-1610
-
-
Van Der Pol, J.1
Kuper, F.G.2
Ooms, E.R.3
-
16
-
-
0030274021
-
Quality and reliability improvement through defect oriented failure analysis
-
P. de Pauw and S. van Haeverbeke, 'Quality and reliability improvement through defect oriented failure analysis', Microelectron. Reliab., 36, 1835-1838 (1996).
-
(1996)
Microelectron. Reliab.
, vol.36
, pp. 1835-1838
-
-
De Pauw, P.1
Van Haeverbeke, S.2
-
17
-
-
11744296686
-
Relation between yield and reliability of integrated circuits: Experimental results and application to continuous early failure rate reduction programs
-
P. Wolbert, 'Relation between yield and reliability of integrated circuits: experimental results and application to continuous early failure rate reduction programs', Proc. 1995 Int. Reliability Physics Symp., 1995.
-
(1995)
Proc. 1995 Int. Reliability Physics Symp.
-
-
Wolbert, P.1
-
19
-
-
0029275729
-
A new framework for part failure-rate prediction models
-
K. L. Wong, 'A new framework for part failure-rate prediction models', IEEE Trans. Reliab., REL-44, 139-146 (1995).
-
(1995)
IEEE Trans. Reliab.
, vol.REL-44
, pp. 139-146
-
-
Wong, K.L.1
-
20
-
-
0029734438
-
A new framework for electronic assembly/system reliability prediction
-
K. L Wong, 'A new framework for electronic assembly/system reliability prediction', Proc. 1996 Ann. R&M Symp., 1996, pp. 270-274.
-
(1996)
Proc. 1996 Ann. R&M Symp.
, pp. 270-274
-
-
Wong, K.L.1
-
23
-
-
0031140226
-
A model for predicting the reliability of a man-machine system
-
C.-M. Liu and A.-H. Wang, 'A model for predicting the reliability of a man-machine system', Qual. Reliab. Engng. Int., 13, 159-165 (1997).
-
(1997)
Qual. Reliab. Engng. Int.
, vol.13
, pp. 159-165
-
-
Liu, C.-M.1
Wang, A.-H.2
-
24
-
-
0038047358
-
Application of fuzzy logic in the assurance sciences
-
D. Verma and J. Knezevic, 'Application of fuzzy logic in the assurance sciences', Proc. 1994 Ann. R&M Symp., 1994, pp. 436-440.
-
(1994)
Proc. 1994 Ann. R&M Symp.
, pp. 436-440
-
-
Verma, D.1
Knezevic, J.2
-
25
-
-
44949286897
-
An application of fuzzy concepts to modelling of reliability analysis
-
T. Onisawa, 'An application of fuzzy concepts to modelling of reliability analysis', Fuzzy Sets Syst., 37, 267-286 (1990).
-
(1990)
Fuzzy Sets Syst.
, vol.37
, pp. 267-286
-
-
Onisawa, T.1
-
26
-
-
0029207896
-
Applying fuzzy cognitive-maps knowledge representation to FMEA
-
E. Pelaez and J. B. Bowles, 'Applying fuzzy cognitive-maps knowledge representation to FMEA', Proc. 1995 Ann. R&M Symp., 1995, pp. 450-455.
-
(1995)
Proc. 1995 Ann. R&M Symp.
, pp. 450-455
-
-
Pelaez, E.1
Bowles, J.B.2
-
27
-
-
11744323966
-
Fuzzy Weibull for risk analysis
-
D. R Weber, 'Fuzzy Weibull for risk analysis', Proc. 1994 Ann. R&M Symp., 1994, pp. 456-461.
-
(1994)
Proc. 1994 Ann. R&M Symp.
, pp. 456-461
-
-
Weber, D.R.1
-
28
-
-
0029325353
-
A combined fuzzy-logic and physics-of-faiture approach to reliability prediction
-
M. Bazu, 'A combined fuzzy-logic and physics-of-faiture approach to reliability prediction', IEEE Trans. Reliab., REL-44, 237-242 (1995).
-
(1995)
IEEE Trans. Reliab.
, vol.REL-44
, pp. 237-242
-
-
Bazu, M.1
-
29
-
-
0030233701
-
Power converter failure rate prediction by Bayesian analyses
-
L. Hart and B. Heller, 'Power converter failure rate prediction by Bayesian analyses', Qual. Reliab. Engng. Int., 12, 365-370 (1996).
-
(1996)
Qual. Reliab. Engng. Int.
, vol.12
, pp. 365-370
-
-
Hart, L.1
Heller, B.2
-
30
-
-
0029729233
-
Combining failure rate data from various sources
-
H. Schaebe, 'Combining failure rate data from various sources', Microelectron. Reliab., 36, 47-54 (1996).
-
(1996)
Microelectron. Reliab.
, vol.36
, pp. 47-54
-
-
Schaebe, H.1
-
32
-
-
0030106634
-
An input-domain based method to estimate software reliability
-
A. Pasquini, E. de Agostino and G. di Marco, 'An input-domain based method to estimate software reliability', IEEE Trans. Reliab., REL-45, 95-105 (1996).
-
(1996)
IEEE Trans. Reliab.
, vol.REL-45
, pp. 95-105
-
-
Pasquini, A.1
De Agostino, E.2
Di Marco, G.3
-
33
-
-
0031166274
-
Improving software reliability forecasting
-
B. Burtschy, et al., 'Improving software reliability forecasting', Microelectron. Reliab., 37, 901-907 (1997).
-
(1997)
Microelectron. Reliab.
, vol.37
, pp. 901-907
-
-
Burtschy, B.1
-
34
-
-
11744371962
-
Assessing reliability progress
-
Reliability Analysis Center
-
RAC, 'Assessing reliability progress', Blueprints for Product Reliability RBPR-4, Reliability Analysis Center, 1996.
-
(1996)
Blueprints for Product Reliability RBPR-4
-
-
-
35
-
-
11744252158
-
Interpretation of en ISO 9000 - Reliability aspects for electronic components
-
CECC, 'Interpretation of EN ISO 9000 - reliability aspects for electronic components', CECC 00 804, 1996.
-
(1996)
CECC 00 804
-
-
-
36
-
-
0029271008
-
Characterisation of functional relationship between temperature and microelectronic reliability
-
P. Lall, M. Pecht and E. B. Hakim, 'Characterisation of functional relationship between temperature and microelectronic reliability', Microelectron. Reliab., 35, 377-402 (1995).
-
(1995)
Microelectron. Reliab.
, vol.35
, pp. 377-402
-
-
Lall, P.1
Pecht, M.2
Hakim, E.B.3
-
38
-
-
0029734774
-
An overview of environmental reliability testing
-
H. Caruso, 'An overview of environmental reliability testing', Proc. 1996 Ann. R&M Symp., 1996, pp. 102-109.
-
(1996)
Proc. 1996 Ann. R&M Symp.
, pp. 102-109
-
-
Caruso, H.1
-
40
-
-
0028514704
-
Reliability engineering based on field information - The way ahead
-
J. Moltoft, 'Reliability engineering based on field information - the way ahead', Qual. Reliab. Engng. Int., 10, 399-409 (1994).
-
(1994)
Qual. Reliab. Engng. Int.
, vol.10
, pp. 399-409
-
-
Moltoft, J.1
-
41
-
-
0031096490
-
Dynamic life-estimation of CMOS ICs in real operating environment: Precise electrical method and MLE
-
K. Son and M. Soma, 'Dynamic life-estimation of CMOS ICs in real operating environment: precise electrical method and MLE', IEEE Trans. Reliab., REL-46, 31-37 (1997).
-
(1997)
IEEE Trans. Reliab.
, vol.REL-46
, pp. 31-37
-
-
Son, K.1
Soma, M.2
-
42
-
-
0030734436
-
"Smart" electronic systems for condition-based health management
-
N. Kelkar, et al, ' "Smart" electronic systems for condition-based health management', Qual. Reliab. Engng. Int., 13, 3-8 (1997).
-
(1997)
Qual. Reliab. Engng. Int.
, vol.13
, pp. 3-8
-
-
Kelkar, N.1
-
43
-
-
0029368189
-
Measuring system and software reliability: Using an automated data collection process
-
B. Murphy and T. Gent, 'Measuring system and software reliability: using an automated data collection process', Qual. Reliab. Engng. Int., 11, 341-353 (1995).
-
(1995)
Qual. Reliab. Engng. Int.
, vol.11
, pp. 341-353
-
-
Murphy, B.1
Gent, T.2
-
44
-
-
0030197271
-
Evaluation of a 2-day time scale of high-R electronic assemblies by in-situ electrical and optomechanical test techniques
-
G. Gregoris, et al., 'Evaluation of a 2-day time scale of high-R electronic assemblies by in-situ electrical and optomechanical test techniques', Qual. Reliab. Engng. Int., 12, 247-252 (1996).
-
(1996)
Qual. Reliab. Engng. Int.
, vol.12
, pp. 247-252
-
-
Gregoris, G.1
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