Combining failure rate data from various sources

Microelectronics Reliability

Volumn 36, Issue 1, 1996, Pages 47-54

  Schabe H ^a  

^a T V Rheinland Industrie Service GmbH   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; ESTIMATION; FAILURE ANALYSIS; MATHEMATICAL MODELS; PROBABILITY DENSITY FUNCTION; RELIABILITY;

ASYMMETRIC LOSS FUNCTION; BAYES APPROACH; BAYES ESTIMATORS; FAILURE RATE DATA; GAMMA DISTRIBUTION; MEAN LIFE TIME; POOLING;

RELIABILITY THEORY;

EID: 0029729233     PISSN: 00262714     EISSN: None     Source Type: Journal    
DOI: 10.1016/0026-2714(95)00061-6     Document Type: Article

References (13)

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13. A. Zeltner "Bayesian estimation and prediction using asymmetric loss function", J. Amer. Statist. Assoc., vol 81, pp.446-451.