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Volumn 36, Issue 11-12 SPEC. ISS., 1996, Pages 1839-1846
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Wafer Level Reliability: Process control for reliability
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Author keywords
[No Author keywords available]
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Indexed keywords
PROCESS CONTROL;
RELIABILITY;
SEMICONDUCTOR DEVICE TESTING;
WSI CIRCUITS;
DEGRADATION;
FEEDBACK CONTROL;
INTEGRATED CIRCUIT MANUFACTURE;
INTEGRATED CIRCUIT TESTING;
NETWORK COMPONENTS;
STRESSES;
WAFER LEVEL RELIABILITY TEST;
WAFER LEVEL RELIABILITY TESTING;
SEMICONDUCTOR DEVICE MANUFACTURE;
WSI CIRCUITS;
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EID: 0030274030
PISSN: 00262714
EISSN: None
Source Type: Journal
DOI: 10.1016/0026-2714(96)00211-9 Document Type: Article |
Times cited : (5)
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References (3)
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