Identifying locations on a substrate for the repeated positioning of AFM samples

Ultramicroscopy

Volumn 68, Issue 4, 1997, Pages 215-221

  Markiewicz, Peter ^a   Goh, M Cynthia ^a  

^a UNIVERSITY OF TORONTO   (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING; COST EFFECTIVENESS; GLASS; LATEXES; MICA; MONOLAYERS; SUBSTRATES;

COPPER LOCATOR GRIDS;

ATOMIC FORCE MICROSCOPY;

ARTICLE; ATOMIC FORCE MICROSCOPY; COST EFFECTIVENESS ANALYSIS; CRYSTALLIZATION; DIAGNOSTIC IMAGING; NONHUMAN; PROTEIN STRUCTURE; REPRODUCIBILITY; SAMPLING; TECHNIQUE;

EID: 0031214354     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0304-3991(97)00035-1     Document Type: Article

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