Model of single event upsets induced by space protons in electronic devices

Proceedings of the European Conference on Radiation and its Effects on Components and Systems, RADECS

Volumn , Issue , 1995, Pages 402-408

  Doucin, B ^a   Carriere, T ^a   Poivey, C ^a   Garnier, P ^a   Beaucour, J ^a   Patin, Y ^a  

^a AIRBUS DEFENCE AND SPACE   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

CONVERGENCE OF NUMERICAL METHODS; ELECTRON DEVICES; IONS; MATHEMATICAL MODELS; PARTICLE DETECTORS; PROTONS; SEMICONDUCTING SILICON; SEMICONDUCTOR JUNCTIONS;

ENERGY DEPOSITION; PROTON KINETIC ENERGIES; PROTON SINGLE EVENT UPSET CROSS SECTION;

RADIATION EFFECTS;

EID: 0029463922     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (16)