Microdosimetric aspects of proton-induced nuclear reactions in thin layers of silicon

IEEE Transactions on Nuclear Science

Volumn 29, Issue 6, 1982, Pages 2012-2016

  Farrell, Gary E ^a   McNulty, Peter J ^a  

^a CLARKSON UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; DOSIMETRY; PROTONS;

SEMICONDUCTING SILICON;

EID: 0020269370     PISSN: 00189499     EISSN: 15581578     Source Type: Journal    
DOI: 10.1109/TNS.1982.4336488     Document Type: Article

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