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Volumn 41, Issue 4, 1997, Pages 627-633

Numerical analysis of poly-TFTs under off conditions

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; ELECTRON TUNNELING; LEAKAGE CURRENTS; NUMERICAL ANALYSIS; POLYCRYSTALLINE MATERIALS; THERMAL EFFECTS;

EID: 0031123149     PISSN: 00381101     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0038-1101(96)00201-8     Document Type: Article
Times cited : (75)

References (18)
  • 12
    • 84920724595 scopus 로고
    • Analysis and characterization of polycrystalline silicon thin-film transistors
    • Colalongo, L. et al., Analysis and Characterization of Polycrystalline Silicon Thin-Film Transistors, in Proc. of the 1995 ESSDERC Conference, 1995, pp. 75-78.
    • (1995) Proc. of the 1995 ESSDERC Conference , pp. 75-78
    • Colalongo, L.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.