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Journal of Applied Physics

Volumn 50, Issue 8, 1979, Pages 5484-5487

Electric field effect on the thermal emission of traps in semiconductor junctions

(3) Vincent, G a Chantre, A a Bois, D a

a UNIVERSITÉ DE LYON (France)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC FIELD EFFECTS; SEMICONDUCTING GALLIUM COMPOUNDS;

SEMICONDUCTOR DIODES;

EID: 0018506275 PISSN: 00218979 EISSN: None Source Type: Journal
DOI: 10.1063/1.326601 Document Type: Article

Times cited : (490)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.