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Volumn 44, Issue 1, 1997, Pages 139-144

On buried oxide effects in SOI lateral bipolar transistors

Author keywords

[No Author keywords available]

Indexed keywords

CHARGE CARRIERS; COMPUTER SIMULATION; ELECTRIC FIELDS; INTERFACES (MATERIALS); MOSFET DEVICES; OXIDES; SEMICONDUCTING FILMS; SEMICONDUCTOR DOPING; SILICA; SILICON ON INSULATOR TECHNOLOGY; SUBSTRATES;

EID: 0030735468     PISSN: 00189383     EISSN: None     Source Type: Journal    
DOI: 10.1109/16.554803     Document Type: Article
Times cited : (2)

References (11)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.