A remark on the barlow-scheuer reliability growth estimation schesme

Technometrics

Volumn 13, Issue 1, 1971, Pages 199-200

  Read, R R ^a  

^a NAVAL POSTGRADUATE SCHOOL   (United States)

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Indexed keywords

EID: 78650704771     PISSN: 00401706     EISSN: 15372723     Source Type: Journal    
DOI: 10.1080/00401706.1971.10488766     Document Type: Article

References (2)

1. BARLOW, R. E. and E. M. SCHETJER (1966). Reliability Growth During a Development Testing Program. Technometrics 8, 53-60.
2. Ayer, M., H. D. BRUNK, G. M. Ewing, W. T. Reid, and E. Silverman (1955). An Empirical Distribution Function for Sampling with Incomplete Information. Ann. Math. Stat. 26, 641-647.