A Bayes Reliability Growth Model for A Development Testing Program

IEEE Transactions on Reliability

Volumn R-36, Issue 5, 1987, Pages 568-572

  Fard, Nasser S ^a   Dietrich, Duane L ^b  

^a NORTHEASTERN UNIVERSITY   (United States)

^b UNIVERSITY OF ARIZONA   (United States)

Author keywords

Bayes; Ordered reliabilities; Reliability growth

Indexed keywords

EID: 84909941154     PISSN: 00189529     EISSN: 15581721     Source Type: Journal    
DOI: 10.1109/TR.1987.5222474     Document Type: Article

References (9)

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