메뉴 건너뛰기




Volumn R-32, Issue 4, 1983, Pages 366-369

A Monte-Carlo Technique for Estimating Lower Confidence Limits on System Reliability Using Pass-Fail Data

Author keywords

Binomial distribution; Monte Carlo simulation; s Confidence limit

Indexed keywords

MATHEMATICAL STATISTICS - MONTE CARLO METHODS;

EID: 0020830391     PISSN: 00189529     EISSN: 15581721     Source Type: Journal    
DOI: 10.1109/TR.1983.5221686     Document Type: Article
Times cited : (19)

References (8)
  • 1
    • 0000805304 scopus 로고    scopus 로고
    • Approximate confidence limits for system reliability
    • R.G. Easterling, “Approximate confidence limits for system reliability”, J. American Statistical Association, vol 67, pp 220-222.
    • J. American Statistical Association , vol.67 , pp. 220-222
    • Easterling, R.G.1
  • 3
    • 0006488619 scopus 로고
    • A Monte Carlo technique for obtaining system reliability confidence limits from component test data
    • Sep
    • L.L. Levy, A.H. Moore, “A Monte Carlo technique for obtaining system reliability confidence limits from component test data”, IEEE Trans. Reliability, vol R-16, 1967 Sep, pp 69-72.
    • (1967) IEEE Trans. Reliability , vol.R-16 , pp. 69-72
    • Levy, L.L.1    Moore, A.H.2
  • 4
    • 0016094652 scopus 로고
    • Approximately optimum confidence bounds for system reliability based on component test data
    • Aug
    • N.R. Mann, F.E. Grubbs, “Approximately optimum confidence bounds for system reliability based on component test data”, Technometrics, vol 16, 1974 Aug, pp 335-347.
    • (1974) Technometrics , vol.16 , pp. 335-347
    • Mann, N.R.1    Grubbs, F.E.2
  • 5
    • 0019070317 scopus 로고
    • A comparison of Monte Carlo techniques for obtaining system reliability confidence limits from component test data
    • Oct
    • A.H. Moore, H.L. Harter, R.C. Snead, “A comparison of Monte Carlo techniques for obtaining system reliability confidence limits from component test data”, IEEE Trans Reliability, vol R-29, 1980 Oct, pp 327-332.
    • (1980) IEEE Trans Reliability , vol.R-29 , pp. 327-332
    • Moore, A.H.1    Harter, H.L.2    Snead, R.C.3
  • 7
    • 0006471877 scopus 로고
    • Bayesian confidence limits for the product of N binomial parameters
    • Dec
    • M.D. Springer, W.E. Thompson, “Bayesian confidence limits for the product of N binomial parameters”, Biometrika, vol 53, 1966 Dec, pp 611-613.
    • (1966) Biometrika , vol.53 , pp. 611-613
    • Springer, M.D.1    Thompson, W.E.2
  • 8
    • 0006504681 scopus 로고
    • Bayesian confidence limits for reliability of redundant systems when tests terminated at first failure
    • Feb
    • M.D. Springer, W.E. Thompson, “Bayesian confidence limits for reliability of redundant systems when tests terminated at first failure”, Technometrics, vol 10, 1968 Feb, pp 29-36.
    • (1968) Technometrics , vol.10 , pp. 29-36
    • Springer, M.D.1    Thompson, W.E.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.